
let’s break down the key factors and formulas that determine magnification in X-ray inspection systems, shedding light on the importance of distance between the sample, the sensor, and the X-ray source. Whether you’re interested in industrial applications or microelectronics, understanding this fundamental concept is crucial. Join us as we demystify the science behind X-ray magnification.
How do we magnify an object in an x-ray image? Let’s check this out. So let’s find out how you magnify on an x-ray inspection system. Now, we just recorded a different view to show you how x-ray images are created on an x-ray machine. If you haven’t seen that one yet, Anthony is going to put a link here so you can go and check it out.
But this, we’re going to use the same setup with an x-ray sensor here on the wall. Our x resource is going to be this flashlight pointing x-ray photos all to the sensor. And what we’re going to find looking through is how would you magnify, and we have a formula here. Do you want this distance between the sample and the sensor data?
Is distance between this sample and the x-ray source, which is our flashlight. Now, the sample is going to be in my hand. And as we can see, as we decrease the one and we increase D two, the magnification is smaller, right? So the formula here is M, which is magnification is one plus D one over the true.
So as we move my sample closer to the sensor, we lower the magnification, and as we move the sample closer to the source, we increase magnification. Right? All the way to the point where it can cover the whole active area of the sensor with the tip of my finger. The other way to see this relationship is if I’m going to leave my sample stationary, I’m going to keep it in this position and what I’m going to do.
So D one is going to be fixed, and what I’m going to do is just change the true. This is between the set, the source, and the sample. And as you can see, as I bring the source closer to my sample, I magnify because did you do this between the source in the sample is in the denominator of that equation.
So if I make the denominator smaller, I make the number bigger. And on the other hand, I can move that source farther away from the sample, thus reducing magnification. Right. So why does it matter if you have an application where you have to see the whole sample in one image? A particle to, for example, you need very little magnification each put the sample as close as possible to the sensor.
On the other hand, if you have an application that requires high magnification like microelectronics or big inspection, you get to bring that sample as close as possible to our source. All right. I hope you enjoy this. And we’re able to clarify how this equation works and how the different parameters play with each other, because it’s critical when you are specifying in your design x-ray machine, including where the x resource is located and how far from the sensor the sample is going to be placed.
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Dr. Bill Cardoso – Founder and CEO of Creative Electron.